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Larre Nelson Phones & Addresses

  • 4 Williamsburg Ln, Attleboro, MA 02703
  • 54 Stone Hedge Ln, Attleboro, MA 02703
  • Watertown, MA
  • New Bedford, MA

Work

Company: Rika denshi america Position: General manager

Industries

Semiconductors

Resumes

Resumes

Larre Nelson Photo 1

General Manager At Rika Denshi America

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Position:
General Manager at Rika Denshi America
Location:
Providence, Rhode Island Area
Industry:
Semiconductors
Work:
Rika Denshi America
General Manager

Business Records

Name / Title
Company / Classification
Phones & Addresses
Larre Nelson
Manager
Rika Denshi America Inc
Industrial Instruments for Measurement, Displ...
112 Frank Mossberg Dr, South Attleboro, MA 02703
Website: testprobes.com
Larre Nelson
Vice President
Rika Denshi America, Inc.
Instruments for Measuring and Testing of Elec...
112 Frank Mossberg Dr, South Attleboro, MA 02703
Larre Nelson
Manager
Rika Denshi America Inc
Industrial Instruments for Measurement, Displ...
112 Frank Mossberg Dr, South Attleboro, MA 02703
Website: testprobes.com
Larre Nelson
Vice President
Rika Denshi America, Inc.
Instruments for Measuring and Testing of Elec...
112 Frank Mossberg Dr, South Attleboro, MA 02703
Larre H. Nelson
President
IKIER TECHNOLOGY, INC
42 Pleasant St, Watertown, MA 02172
385 S Main St, Attleboro, MA
Larre Nelson
Secretary
RIKA ELECTRONICS INTERNATIONAL, INC
112 Frank Mossberg Dr, Attleboro, MA 02703
54 Stone Hedge Ln, Attleboro, MA 02703

Publications

Us Patents

Sockets For Testing Electronic Packages Having Contact Probes With Contact Tips Easily Maintainable In Optimum Operational Condition

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US Patent:
6685492, Feb 3, 2004
Filed:
May 17, 2002
Appl. No.:
10/151060
Inventors:
John M. Winter - Wrentham MA
Larre H. Nelson - Attleboro MA
John C. Bergeron - Attleboro MA
Assignee:
Rika Electronics International, Inc. - Attleboro MA
International Classification:
H01R 1324
US Classification:
439219, 324754, 439700
Abstract:
An electrical socket ( ) mounts a plurality of electrical contact probes ( ) for providing an electrical connection between terminals of an electronic package ( ) received in a seat ( ) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip ( ) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface ( ) for interengagement with a removable retainer member of the socket.

Apparatus For Interfacing Electronic Packages And Test Equipment

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US Patent:
6992496, Jan 31, 2006
Filed:
Mar 5, 2003
Appl. No.:
10/382078
Inventors:
John M. Winter - Wrentham MA,
Larre H. Nelson - Attleboro MA,
John C. Bergeron - Attleboro MA,
Lourie M. Sarcione - Attleboro MA,
Assignee:
Rika Electronics International, Inc. - Attleboro MA
International Classification:
G01R 31/02
US Classification:
324755, 324754
Abstract:
A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Electrical Test Probes, Methods Of Making, And Methods Of Using

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US Patent:
7315176, Jan 1, 2008
Filed:
Jun 16, 2005
Appl. No.:
11/155230
Inventors:
Larre H. Nelson - Attleboro MA,
John M. Winter - Wrentham MA,
Assignee:
Rika Denshi America, Inc. - Attleboro MA
International Classification:
G01R 31/02
US Classification:
324761, 324754
Abstract:
Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.

Apparatus For Interfacing Electronic Packages And Test Equipment

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US Patent:
7362114, Apr 22, 2008
Filed:
Oct 27, 2004
Appl. No.:
10/974147
Inventors:
John M. Winter - Wrentham MA,
Larre H. Nelson - Attleboro MA,
John C. Bergeron - Attleboro MA,
Lourie M. Sarcione - Attleboro MA,
Assignee:
Rika Electronics International, Inc. - Attleboro MA
International Classification:
G01R 31/02
US Classification:
324755, 324754
Abstract:
A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

Electrical Test Probes And Methods Of Making The Same

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US Patent:
2003010, Jun 5, 2003
Filed:
Sep 24, 2002
Appl. No.:
10/254054
Inventors:
Theresa Souza - Cranston RI,
Larre Nelson - Attleboro MA,
International Classification:
G01R031/02
US Classification:
324/754000
Abstract:
A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.
Larre H Nelson from Attleboro, MA, age ~74 Get Report